The Tech Briefs TV Channel
Sign In | Support

Ultrasharp Microscope Probes
Joseph Lyding, Professor of Electrical & Computer Engineering at the University of Illinois, has recently developed a new method for sharpening probes for Scan Probe Microscopes. Using ions to sharpen the tip to an atomic level, the ultrasharp probes allow for an extremely high, atomic resolution in the microscope's images.
Related Videos